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SAE J17522-2016-DataScience-ir

SAE J17522-2016

 

 

کتابخانه الکترونیکی دیتا ساینس

شناسه: SAE J17522-2016

عنوان: Measurement of Radiated Emissions from Integrated Circuits—Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz

لینک: http://standards.sae.org/j1752/2_201609/

قیمت: ۴۹۰۰ تومان (۱۰ درصد تخفیف اعضاء ویژه)

 

This SAE Recommended Practice defines a method for evaluating the near field electric or magnetic component of the electromagnetic field at the surface of an integrated circuit (IC). This technique is capable of providing a detailed pattern of the RF sources internal to the IC. The resolution of the pattern is determined by the characteristics of the probes used and the precision of the mechanical probe positioner. The method is usable over the 10 MHz to 3 GHz frequency range with existing probe technology. The probe is mechanically scanned according to a programmed pattern in a plane parallel or perpendicular to the IC surface and the data is computer processed.

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